• 文献标题:   Half-Integer Quantum Hall Effect in Gate-Controlled Epitaxial Graphene Devices
  • 文献类型:   Article
  • 作  者:   TANABE S, SEKINE Y, KAGESHIMA H, NAGASE M, HIBINO H
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS EXPRESS
  • ISSN:   1882-0778
  • 通讯作者地址:   NTT Corp
  • 被引频次:   54
  • DOI:   10.1143/APEX.3.075102
  • 出版年:   2010

▎ 摘  要

High-quality monolayer graphene was grown on the Si face of SiC by thermal decomposition, and its electrical properties were investigated in top-gated devices. At 2 K, the carrier mobility of the graphene exceeded 10,000 cm(2) V(-1) s(-1) and the half-integer quantum Hall effect was observed. The quantum Hall states were even observed at various carrier densities when top-gate bias was applied. These findings suggest high-quality epitaxial graphene possesses the unique nature of monolayer graphene and is robust against device fabrication, which holds potential for graphene-based electronics applications. (C) 2010 The Japan Society of Applied Physics