• 文献标题:   Structural evolution in CVD graphene chemically oxidized by sulphuric acid
  • 文献类型:   Article
  • 作  者:   WANG YY, JIANG J, LIN TH, NAN HY, GAO CW, NI ZH, GAO RX, ZHONG B, WEN GW
  • 作者关键词:   oxidation pit, graphene oxide, sulphuric acid
  • 出版物名称:   JOURNAL OF RAMAN SPECTROSCOPY
  • ISSN:   0377-0486 EI 1097-4555
  • 通讯作者地址:   Harbin Inst Technol Weihai
  • 被引频次:   2
  • DOI:   10.1002/jrs.4638
  • 出版年:   2015

▎ 摘  要

The role of sulphuric acid (H2SO4) in fabrication graphene oxide besides as intercalant has not been well addressed. In this work, Raman spectroscopy is used to monitor structural evolution in chemical vapor deposition (CVD) graphene chemically oxidized by dilute H2SO4. From the analysis of Raman spectra of oxidized graphene, we propose that oxidation first initiates at preexisting defects, and vacancy-like defects are formed. Following is the radial growth of the vacancy, and oxidation pits appear in graphene. This assumption is further confirmed by atomic force microscope measurement. It is also found that with increase of amounts of defects, G peak is blue shift, and this is explained by defect and hole doping effect. Hole doping in graphene is much stronger at hexagon regions near the oxidation pits. This work helps in understanding the role of H2SO4 in fabrication graphene oxide as oxidizer as well as helps in obtaining structure information of graphene oxide. Copyright (c) 2015 John Wiley & Sons, Ltd.