• 文献标题:   Shallow Impurity States in Doped Silicon Substrates Enabling High Responsivity for Graphene Mid-Infrared Photodetectors
  • 文献类型:   Article
  • 作  者:   HO VX, WANG YF, HOWE L, COONEY MP, VINH NQ
  • 作者关键词:   shallow impurity state, midinfrared photodetector, photogating effect, doped silicon, nanostructure, graphene
  • 出版物名称:   ACS APPLIED NANO MATERIALS
  • ISSN:  
  • 通讯作者地址:  
  • 被引频次:   4
  • DOI:   10.1021/acsanm.2c02011 EA AUG 2022
  • 出版年:   2022

▎ 摘  要

The practical realization of optoelectronic devices operating in the mid-infrared region is stimulated by both fundamental interests and applications ranging from spectroscopy, sensing, imaging, and security to communications. Despite significant achievements in semiconductors, essential barriers including the cryogenic operation and complicated growth processes prevent the applications of mid-infrared detectors. Graphene is widely used in modern electronics, but its low absorption limits photo-detection. It is therefore of interest to extend the performance of graphene photodetectors into the mid-infrared region. Here, we first demonstrate pure graphene photodetectors operating in a broadband range from the deep ultraviolet to the mid-infrared region by utilizing photoionization of shallow impurities and over band gap excitation in highly doped Si:B and Si:P substrates. We have observed a photoresponsivity of similar to 5 A/W under the mid-infrared illumination at room temperature. This approach paves the way for a concept of dual-photogating effect induced by both highly doped Si substrates and nanomaterials/nanostructures on top of graphene field-effect transistors.