• 文献标题:   Local electrical stress-induced doping and formation of monolayer graphene P-N junction
  • 文献类型:   Article
  • 作  者:   YU TH, LIANG CW, KIM CD, YU B
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   SUNY Albany
  • 被引频次:   13
  • DOI:   10.1063/1.3593131
  • 出版年:   2011

▎ 摘  要

We demonstrated doping in monolayer graphene via local electrical stressing. The doping, confirmed by the resistance-voltage transfer characteristics of the graphene system, is observed to continuously tunable from N-type to P-type as the electrical stressing level (voltage) increases. Two major physical mechanisms are proposed to interpret the observed phenomena: modifications of surface chemistry for N-type doping (at low-level stressing) and thermally-activated charge transfer from graphene to SiO2 substrate for P-type doping (at high-level stressing). The formation of P-N junction on two-dimensional graphene monolayer is demonstrated with complementary doping based on locally applied electrical stressing. (C) 2011 American Institute of Physics. [doi:10.1063/1.3593131]