• 文献标题:   High Responsivity and Detectivity Graphene-Silicon Majority Carrier Tunneling Photodiodes with a Thin Native Oxide Layer
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   PARK HK, CHOI J
  • 作者关键词:   photoinduced amplification, schottky barrier height lowering, tunneling, graphene, silicon
  • 出版物名称:   ACS PHOTONICS
  • ISSN:   2330-4022
  • 通讯作者地址:   Kyung Hee Univ
  • 被引频次:   2
  • DOI:   10.1021/acsphotonics.8b00247
  • 出版年:   2018

▎ 摘  要

A photocurrent amplifier operable at low bias voltages with high responsivity and detectivity is highly demanding for various optoelectronic applications. This study shows majority carrier graphene-native oxide-silicon (GOS) photocurrent amplifiers complying with the demands. The photocurrent amplification is primarily attributed to the photoinduced Schottky barrier height (SBH) lowering for majority carriers. The unavoidably formed thin native oxide layer between graphene and silicon during the wet graphene transfer process plays significant roles in lowering of the dark leakage current as well as photoinduced SBH lowering. As a result, the photocurrent to dark current ratio is as high as similar to 12.7 at the optical power density of 1.45 mW cm(-2). These GOS devices show a high responsivity of 5.5 AW(-1) at an optical power (458 nm in wavelength) of 15 mu Wcm(-2), which corresponds to similar to 1400% quantum efficiency. Further the response speed is as fast as a few ten-microseconds. Thus, these GOS majority carrier photodiodes show the highest detectivity (2.35 x 10(10) cm Hz(1/2) W1-) among previously reported graphene-silicon photodiodes. However, the responsivity decreases with the optical power density due to the increasing recombination rate through the interface states proportional to the optical power density.