• 文献标题:   Single Indium Atoms and Few-Atom Indium Clusters Anchored onto Graphene via Silicon Heteroatoms
  • 文献类型:   Article
  • 作  者:   ELIBOL K, MANGLER C, O REGAN DD, MUSTONEN K, EDER D, MEYER JC, KOTAKOSKI J, HOBBS RG, SUSI T, BAYER BC
  • 作者关键词:   single atom, nanocluster, 2d material, graphene, anchoring, aberrationcorrected scanning transmission electron microscopy
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:  
  • 被引频次:   14
  • DOI:   10.1021/acsnano.1c03535 EA AUG 2021
  • 出版年:   2021

▎ 摘  要

Single atoms and few-atom nanoclusters are of high interest in catalysis and plasmonics, but pathways for their fabrication and placement remain scarce. We report here the self-assembly of room-temperature-stable single indium (In) atoms and few-atom In clusters (2-6 atoms) that are anchored to substitutional silicon (Si) impurity atoms in suspended monolayer graphene membranes. Using atomically resolved scanning transmission electron microscopy (STEM), we find that the symmetry of the In structures is critically determined by the three- or fourfold coordination of the Si "anchors". All structures are produced without electron-beam induced materials modification. In turn, when activated by electron beam irradiation in the STEM, we observe in situ the formation, restructuring, and translation of the Si-anchored In structures. Our results on In-Si-graphene provide a materials system for controlled selfassembly and heteroatomic anchoring of single atoms and few-atom nanoclusters on graphene.