▎ 摘　　要

On nanomaterials characterization, the evolution from the broadly utilized micro-Raman spectroscopy to a nanoscale regime is taking place with the improvements in tip-enhanced Raman spectroscopy (TERS). It is not clear, however, to which extent protocols developed within the diffraction-limited far-field configuration apply to the near-field regime. Defects in graphene nanoflakes are investigated in this work in both micro and nano regimes, showing that the Raman characteristics utilized to quantify defects in the far-field regime actually change in the presence of the TERS tip, generating incompatible results. The micro-to-nano spectral mismatch can be modeled using a theory of spatial coherence in near-field Raman scattering, from which a parameterization procedure can be derived in order to obtain consistent results. The incom-patibilities observed here for graphene should also happen in other structures relevant to nanoscience and nanotechnology when explored in the nano-Raman regime, and they can be resolved similarly.