▎ 摘　　要

A graphene sample supported on SiO2 with pristine and plasma-hydrogenated parts is investigated by friction force microscopy. An initial contrast in friction is apparent between the two regions. A tip induced cleaning of the surface in the course of continuous scanning results in a very clean surface accompanied with a reduction of the friction force by a factor of up to 4. The contamination is adhering stronger to hydrogenated regions, but once cleaned, the frictional behavior is the same on pristine and hydrogenated graphene. Raman imaging demonstrates that the hydrogenation remains intact under the mechanical treatment. (C) 2014 AIP Publishing LLC.