• 文献标题:   Mitigating graphene etching on SiO2 during fluorination by XeF2
  • 文献类型:   Article
  • 作  者:   COPETTI G, NUNES EH, SOARES GV, RADTKE C
  • 作者关键词:   carbon material, xps, surface, graphene, fluorination
  • 出版物名称:   MATERIALS LETTERS
  • ISSN:   0167-577X EI 1873-4979
  • 通讯作者地址:   Univ Fed Rio Grande do Sul
  • 被引频次:   2
  • DOI:   10.1016/j.matlet.2019.05.086
  • 出版年:   2019

▎ 摘  要

Fluorination is a promising functionalization method for bandgap opening in graphene on SiO2 substrates. Exposure to XeF2 is a simple approach among several techniques. However etching of the graphene layer occurs. We observed that the mechanism behind etching is the interaction of fluorine containing species with the underlying SiO2. Pulsed XeF2 exposure is shown to suppress etching, resulting in high-quality and homogeneous fluorographene in large areas. (C) 2019 Published by Elsevier B.V.