• 文献标题:   Defects of graphene on Ir(111): Rotational domains and ridges
  • 文献类型:   Article
  • 作  者:   LOGINOVA E, NIE S, THURMER K, BARTELT NC, MCCARTY KF
  • 作者关键词:   electron microscopy, graphene, impuritie, low energy electron diffraction, materials preparation, scanning tunnelling microscopy
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Sandia Natl Labs
  • 被引频次:   146
  • DOI:   10.1103/PhysRevB.80.085430
  • 出版年:   2009

▎ 摘  要

We use low-energy electron microscopy (LEEM), low-energy electron diffraction (LEED), and scanning tunneling microscopy (STM) to study different orientations of single-layer graphene sheets on Ir(111). The most-abundant orientation has previously been characterized in the literature. Using selective-area LEED we find three other variants, which are rotated 14 degrees, 18.5 degrees, and 30 degrees with respect to the most common variant. The similar to 30 degrees-rotated structure is also studied by STM. We propose that all four variants are moireacute structures that can be classified using simple geometric rules involving periodic and quasiperiodic structural motifs. In addition, LEEM reveals that linear defects form in the graphene sheets during cooling from the synthesis temperature. STM shows that these defects are ridges, suggesting that the graphene sheets delaminate locally as the Ir substrate contracts.