• 文献标题:   Atomic resolution electrostatic potential mapping of graphene sheets by off-axis electron holography
  • 文献类型:   Article
  • 作  者:   COOPER D, PAN CT, HAIGH S
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-8979 EI 1089-7550
  • 通讯作者地址:   Univ Grenoble Alpes
  • 被引频次:   9
  • DOI:   10.1063/1.4883192
  • 出版年:   2014

▎ 摘  要

Off-axis electron holography has been performed at atomic resolution with the microscope operated at 80 kV to provide electrostatic potential maps from single, double, and triple layer graphene. These electron holograms have been reconstructed in order to obtain information about atomically resolved and mean inner potentials. We propose that off-axis electron holography can now be used to measure the electrical properties in a range of two-dimensional semiconductor materials and three dimensional devices comprising stacked layers of films to provide important information about their electrical properties. (C) 2014 AIP Publishing LLC.