• 文献标题:   Harnessing Thermoelectric Puddles via the Stacking Order and Electronic Screening in Graphene
  • 文献类型:   Article
  • 作  者:   ZHAO M, KIM D, LEE Y, LING N, ZHENG S, LEE YH, YANG H
  • 作者关键词:   thermoelectric puddle, atomicscale thermopower, lattice symmetry, electronic screening, inoperando thermal spectroscopy
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:  
  • 被引频次:   3
  • DOI:   10.1021/acsnano.1c00030 EA MAR 2021
  • 出版年:   2021

▎ 摘  要

Thermoelectricity has been investigated mostly on the macroscopic scale despite the fact that its origin is linked to the local electronic band structure of materials. While the role of thermopower from microscopic structures (e.g., surfaces or grain boundaries) increases for emerging thermoelectric materials, manipulating thermoelectric puddles, spatially varying levels of thermoelectric power on the nanometer scale, remains unexplored. Here, we illustrate thermoelectric puddles that can be harnessed via the stacking order and electronic screening in graphene. The local thermoelectric elements were investigated by gate-tunable scanning thermoelectric microscopy on the atomic scale, revealing the roles of local lattice symmetry, impurity charge scatterings, and mechanical strains in the thermopower system. The long-range screening of electrons at the Dirac point in graphene, which could be reached by in-operando spectroscopy, allowed us to unveil distinct thermoelectric puddles in the graphene that are susceptible to the stacking order and external strain. Thus, manipulating thermoelectric puddles via a lattice symmetry and electronic engineering will realize practical thermopower systems with low-dimensional materials.