• 文献标题:   Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
  • 文献类型:   Article
  • 作  者:   MEYER JC, EDER F, KURASCH S, SKAKALOVA V, KOTAKOSKI J, PARK HJ, ROTH S, CHUVILIN A, EYHUSEN S, BENNER G, KRASHENINNIKOV AV, KAISER U
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW LETTERS
  • ISSN:   0031-9007 EI 1079-7114
  • 通讯作者地址:   Univ Ulm
  • 被引频次:   253
  • DOI:   10.1103/PhysRevLett.108.196102
  • 出版年:   2012

▎ 摘  要

We present an accurate measurement and a quantitative analysis of electron-beam-induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displacement ("knock-on'') cross section by counting the lost atoms as a function of the electron-beam energy and applied dose. Further, we separate knock-on damage (originating from the collision of the beam electrons with the nucleus of the target atom) from other radiation damage mechanisms (e.g., ionization damage or chemical etching) by the comparison of ordinary (C-12) and heavy (C-13) graphene. Our analysis shows that a static lattice approximation is not sufficient to describe knock-on damage in this material, while a very good agreement between calculated and experimental cross sections is obtained if lattice vibrations are taken into account.