• 文献标题:   Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging
  • 文献类型:   Article
  • 作  者:   SHAN XN, CHEN S, WANG H, CHEN ZX, GUAN Y, WANG YX, WANG SP, CHEN HY, TAO NJ
  • 作者关键词:   graphene, quantum capacitance, plasmonic imaging, electron hole puddle
  • 出版物名称:   ADVANCED MATERIALS
  • ISSN:   0935-9648 EI 1521-4095
  • 通讯作者地址:   Nanjing Univ
  • 被引频次:   18
  • DOI:   10.1002/adma.201502822
  • 出版年:   2015

▎ 摘  要

Local quantum capacitance of graphene is imaged with plasmonics- based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.