• 文献标题:   Rectification in three-terminal graphene junctions
  • 文献类型:   Article
  • 作  者:   JACOBSEN A, SHORUBALKO I, MAAG L, SENNHAUSER U, ENSSLIN K
  • 作者关键词:   electric admittance, elemental semiconductor, fluctuation, graphene, nanotechnology, rectification, semiconductor heterojunction
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   ETH
  • 被引频次:   42
  • DOI:   10.1063/1.3464978
  • 出版年:   2010

▎ 摘  要

Nonlinear electrical properties of graphene-based three-terminal nanojunctions are presented. Intrinsic rectification of voltage is observed up to room temperature. The sign and the efficiency of the rectification can be tuned by a gate. Changing the charge carrier type from holes to electrons results in a change in the rectification sign. At a bias < 20 mV and at a temperature below 4.2 K the sign and the efficiency of the rectification are governed by universal conductance fluctuations. (C) 2010 American Institute of Physics. [doi:10.1063/1.3464978]