• 文献标题:   Few-layer graphene growth on 6H-SiC(0001) surface at low temperature via Ni-silicidation reactions
  • 文献类型:   Article
  • 作  者:   KANG CY, FAN LL, CHEN S, LIU ZL, XU PS, ZOU CW
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Sci Technol China
  • 被引频次:   15
  • DOI:   10.1063/1.4729876
  • 出版年:   2012

▎ 摘  要

Few-layer graphene (FLG) has been prepared by thermal annealing of SiC crystal via the surface Ni-silicidation reactions. Results reveal that the temperature plays an important role for the final FLG quality and the optimized annealing temperature is about 800 degrees C. The investigation of surface morphology and microstructure for the FLG sample indicates that after the rapid cooling, the carbon atoms will segregate to form the FLG layer and the NiSix particles will congregate on the top surface. The mechanism of the FLG formation on SiC surface assisted by the Ni ultra-thin layer is briefly discussed based on the experimental results. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4729876]