• 文献标题:   Correlating Raman Spectral Signatures with Carrier Mobility in Epitaxial Graphene: A Guide to Achieving High Mobility on the Wafer Scale
  • 文献类型:   Article
  • 作  者:   ROBINSON JA, WETHERINGTON M, TEDESCO JL, CAMPBELL PM, WENG X, STITT J, FANTON MA, FRANTZ E, SNYDER D, VANMIL BL, JERNIGAN GG, MYERSWARD RL, EDDY CR, GASKILL DK
  • 作者关键词:  
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984
  • 通讯作者地址:   Penn State Univ
  • 被引频次:   139
  • DOI:   10.1021/nl901073g
  • 出版年:   2009

▎ 摘  要

We report a direct correlation between carrier mobility and Raman topography of epitaxial graphene (EG) grown on silicon carbide (SiC). We show the Hall mobility of material on SiC(0001) is highly dependent on thickness and monolayer strain uniformity. Additionally, we achieve high mobility epitaxial graphene (18100 cm(2)/(V s) at room temperature) on SiC(000 (1) over bar) and show that carrier mobility depends strongly on the graphene layer stacking.