• 文献标题:   AFM-based model of percolation. in graphene-based polymer nanocomposites
  • 文献类型:   Article
  • 作  者:   SYURIK J, ALYABYEVA N, ALEKSEEV A, AGEEV OA
  • 作者关键词:   nanocomposite, electrical propertie, modeling, scanning electron microscopy sem, atomic force microscopy afm
  • 出版物名称:   COMPOSITES SCIENCE TECHNOLOGY
  • ISSN:   0266-3538 EI 1879-1050
  • 通讯作者地址:   KIT
  • 被引频次:   14
  • DOI:   10.1016/j.compscitech.2014.02.006
  • 出版年:   2014

▎ 摘  要

Here, we show that a prediction of conductivity in composites can be improved by replacing fitting parameters of the percolation models by information on composite's microstructure. The methodology was demonstrated on the modified McCullough's structure-oriented model combined with current maps obtained by Conductive Atomic Force Microscopy (CA-AFM). The approach was tested on nanocomposites with graphene nanoplatelets (GNPs/PS) and proved to be coherent with experimental conductivity measurements and able to predict a percolation threshold. For the composite GNPs/PS both experimental and calculated percolation thresholds are approximately equal to 0.9 wt.% of GNPs. The model can be used for a prediction of conductivity of different kinds of conductive-dielectric composites. (C) 2014 Elsevier Ltd. All rights reserved.