• 文献标题:   Voltage and temperature dependencies of conductivity in gated graphene
  • 文献类型:   Article
  • 作  者:   VASKO FT, RYZHII V
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   NAS Ukraine
  • 被引频次:   114
  • DOI:   10.1103/PhysRevB.76.233404
  • 出版年:   2007

▎ 摘  要

The resistivity of gated graphene is studied taking into account electron and hole scattering by short- and long-range structural imperfections (the characteristics of disorder were taken from the scanning tunneling microscopy data) and by acoustic phonons. The calculations are based on the quasiclassical kinetic equation with the normalization condition fixed by surface charge. The gate-voltage and temperature effects on the resistance peak, which is centered at the point of intrinsic conductivity, are found to be in agreement with the transport measurements.