▎ 摘　　要

In this paper, high temperature direct current (DC) performance of bilayer epitaxial graphene device on SiC substrate is studied in a temperature range from 25 degrees C to 200 degrees C. At a gate voltage of -8 V (far from Dirac point), the drainsource current decreases obviously with increasing temperature, but it has little change at a gate bias of +8 V (near Dirac point). The competing interactions between scattering and thermal activation are responsible for the different reduction tendencies. Four different kinds of scatterings are taken into account to qualitatively analyze the carrier mobility under different temperatures. The devices exhibit almost unchanged DC performances after high temperature measurements at 200 degrees C for 5 hours in air ambience, demonstrating the high thermal stabilities of the bilayer epitaxial graphene devices.