• 文献标题:   Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene
  • 文献类型:   Article
  • 作  者:   BURTON OJ, MASSABUAU FCP, VEIGANGRADULESCU VP, BRENNAN B, POLLARD AJ, HOFMANN S
  • 作者关键词:   single crystal, cu, copper, epitaxial metal film, graphene, 2d material, chemical vapor deposition
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Univ Cambridge
  • 被引频次:   1
  • DOI:   10.1021/acsnano.0c05685
  • 出版年:   2020

▎ 摘  要

We report on an approach to bring together single crystal metal catalyst preparation and graphene growth in a combined process flow using a standard cold-wall chemical vapor deposition (CVD) reactor. We employ a sandwich arrangement between a commercial polycrystalline Cu foil and c-plane sapphire wafer and show that close-spaced vacuum sublimation across the confined gap can result in an epitaxial, single-crystal Cu(111) film at high growth rate. The arrangement is scalable (we demonstrate 2 '' wafer scale) and suppresses reactor contamination with Cu. While starting with an impure Cu foil, the freshly prepared Cu film is of high purity as measured by time-of-flight secondary ion mass spectrometry. We seamlessly connect the initial metallization with subsequent graphene growth via the introduction of hydrogen and gaseous carbon precursors, thereby eliminating contamination due to substrate transfer and common lengthy catalyst pretreatments. We show that the sandwich approach also enables for a Cu surface with nanometer scale roughness during graphene growth and thus results in high quality graphene similar to previously demonstrated Cu enclosure approaches. We systematically explore the parameter space and discuss the opportunities, including subsequent dry transfer, generality, and versatility of our approach particularly regarding the cost-efficient preparation of different single crystal film orientations and expansion to other material systems.