• 文献标题:   Very low energy electron microscopy of graphene flakes
  • 文献类型:   Article
  • 作  者:   MIKMEKOVA E, BOUYANFIF H, LEJEUNE M, MULLEROVA I, HOVORKA M, UNCOVSKY M, FRANK L
  • 作者关键词:   graphene, very low energy stem
  • 出版物名称:   JOURNAL OF MICROSCOPY
  • ISSN:   0022-2720
  • 通讯作者地址:   Inst Sci Instruments ASCR
  • 被引频次:   7
  • DOI:   10.1111/jmi.12049
  • 出版年:   2013

▎ 摘  要

Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.