▎ 摘　　要

We describe the results of Brownian dynamics (BD) simulations of an atomic force microscope (AFM) tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate that the experimentally observed reduction of friction with an increasing number of graphene layers in case of a narrow scanning tip can be a result of decreased sample deformation energy due to increased local contact stiffness under the scanning tip. Simulations with varying scan rates indicate that surface relaxation at a given temperature can affect the frictional characteristics of atomically thin sheets in a manner not explained by conventional thermally activated models.