▎ 摘　　要

The intrinsic characteristics of novel devices and materials are often misunderstood due to the characterization methods which are developed to analyze existing devices or materials. Even though graphene is a very well-known material, there hasn't been a proper method to assess the density and energy levels of defects in graphene non-destructively, especially after the device fabrication. Here, we report a new non-destructive defect analysis method, amplitude-modulated discharge current analysis (AMDCA). The validity of this method was confirmed using a graphene field effect transistor with physically predefined defect densities in the channel. Charge trap densities (N-ct) of the order of similar to 10(12) cm(-2) were observed at the defect level in the range of 0.15-0.29 eV. This method can be very useful for the in-depth study of graphene devices as well as other two-dimensional materials that don't have a body contact. (C) 2021 Published by Elsevier Ltd.