• 文献标题:   Temperature and strain-rate dependent fracture strength of graphene
  • 文献类型:   Article
  • 作  者:   ZHAO H, ALURU NR
  • 作者关键词:   internal stresse, lanthanum compound, mos capacitor, mosfet
  • 出版物名称:   JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-8979
  • 通讯作者地址:   Univ Illinois
  • 被引频次:   185
  • DOI:   10.1063/1.3488620
  • 出版年:   2010

▎ 摘  要

We investigate the variation in fracture strength of graphene with temperature, strain rate, and crack length using molecular dynamics (MD) simulations, kinetic analysis of fracture with a nonlinear elastic relation, and the quantized fracture mechanics theory. Young's modulus does not vary significantly with temperature until about 1200 K, beyond which the material becomes softer. Temperature plays a more important role in determining the fracture strength of graphene. Our studies suggest that graphene can be a strong material even, when subjected to variations in temperature, strain rate, and cracks. (C) 2010 American Institute of Physics. [doi:10.1063/1.3488620]