• 文献标题:   The electronic thickness of graphene
  • 文献类型:   Article
  • 作  者:   RICKHAUS P, LIU MH, KURPAS M, KURZMANN A, LEE Y, OVERWEG H, EICH M, PISONI R, TAMAGUCHI T, WANTANABE K, RICHTER K, ENSSLIN K, IHN T
  • 作者关键词:  
  • 出版物名称:   SCIENCE ADVANCES
  • ISSN:   2375-2548
  • 通讯作者地址:   Swiss Fed Inst Technol
  • 被引频次:   2
  • DOI:   10.1126/sciadv.aay8409
  • 出版年:   2020

▎ 摘  要

When two dimensional crystals are atomically close, their finite thickness becomes relevant. Using transport measurements, we investigate the electrostatics of two graphene layers, twisted by theta = 22 degrees such that the layers are decoupled by the huge momentum mismatch between the K and K' points of the two layers. We observe a splitting of the zero-density lines of the two layers with increasing interlayer energy difference. This splitting is given by the ratio of single-layer quantum capacitance over interlayer capacitance C-m and is therefore suited to extract C-m. We explain the large observed value of C-m by considering the finite dielectric thickness d(g) of each graphene layer and determine d(g) approximate to 2.6 angstrom. In a second experiment, we map out the entire density range with a Fabry-Perot resonator. We can precisely measure the Fermi wavelength lambda in each layer, showing that the layers are decoupled. Our findings are reproduced using tight-binding calculations.