• 文献标题:   An ultraviolet photoelectron spectroscopy study on bandgap broadening of epitaxial graphene on SiC with surface doping
  • 文献类型:   Article
  • 作  者:   HU YF, LIU JL, DOU WT, MAO KL, GUO LX, CHONG LY, HU JC, YUAN H, HE YJ, GUO H, ZHANG YM
  • 作者关键词:  
  • 出版物名称:   CARBON
  • ISSN:   0008-6223 EI 1873-3891
  • 通讯作者地址:   Xidian Univ
  • 被引频次:   0
  • DOI:   10.1016/j.carbon.2019.10.043
  • 出版年:   2020

▎ 摘  要

The bandgap of epitaxial graphene thermally grown on 4He-SiC(0001) can be widened via a novel charge transfer mechanism by modifying the buffer layer and surface of SiC with substrate doping before epitaxial graphene growth. High-resolution photoemission spectroscopy base on synchrotron radiation reveal that the bandgap broadening of epitaxial graphene is attributed to modification of buffer layer between epitaxial graphene and the substrates, and both donor-acceptor and bulk atoms injected in the SiC make the bandgap of EG on those substrates broaden. This novel bandgap broadening mechanism via substrates doping will provide a simple and effective approach to nondestructively broad the bandgap of epitaxial graphene for future electronics application. (C) 2019 Elsevier Ltd. All rights reserved.