• 文献标题:   Probing the electronic structure of graphene sheets with various thicknesses by scanning transmission X-ray microscopy
  • 文献类型:   Article
  • 作  者:   BAI LL, LIU JY, ZHAO GQ, GAO J, SUN XH, ZHONG J
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Soochow Univ
  • 被引频次:   1
  • DOI:   10.1063/1.4853915
  • 出版年:   2013

▎ 摘  要

The electronic structure of an aggregation of graphene sheets with various thicknesses was probed by scanning transmission X-ray microscopy. A uniform oxidation of the graphene sheets in the flat area was observed regardless of the thickness, while in the folded area the result could be strongly affected by the geometry. Moreover, thick parts of the aggregation showed strong angle-dependence to the incident X-ray, while thin parts showed less angle-dependence, which might be related to the surface wrinkles and ripples. The electronic structure differences due to the geometry and thickness suggest a complicated situation in the aggregation of graphene sheets. (C) 2013 AIP Publishing LLC.