• 文献标题:   Temperature tuned defect induced magnetism in reduced graphene oxide
  • 文献类型:   Article
  • 作  者:   KHURANA G, KUMAR N, KOTNALA RK, NAUTIYAL T, KATIYAR RS
  • 作者关键词:  
  • 出版物名称:   NANOSCALE
  • ISSN:   2040-3364 EI 2040-3372
  • 通讯作者地址:   Univ Puerto Rico
  • 被引频次:   59
  • DOI:   10.1039/c3nr34291c
  • 出版年:   2013

▎ 摘  要

The existence of ferromagnetism in the wonder material graphene has opened up the path for many future spintronics and memory applications. But simultaneously it is very important to understand the variation of these properties with temperature in regards to the device applications. Here we observed defect induced ferromagnetism in chemically reduced graphene and the effect of temperature on it. Several theoretical studies have proved that the main cause of ferromagnetism in graphene is due to various defects. The observed results established that these defects can be mended by treating the samples at elevated temperatures but sacrificing the ferromagnetism simultaneously. Hence, temperature plays a crucial role in controlling the magnetism as well as the defects in graphene. In this study we revealed that at 600 degrees C the self-repair mechanism helps the defects to mend but resulting in the decrement of magnetization and providing a good quality graphene with less defects.