• 文献标题:   Ohmic contact in graphene/SnSe2 Van Der Waals heterostructures and its device performance from ab initio simulation
  • 文献类型:   Article
  • 作  者:   LI H, XU PP, LIANG JK, LIU FB, LUO J, LU J
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF MATERIALS SCIENCE
  • ISSN:   0022-2461 EI 1573-4803
  • 通讯作者地址:   North China Univ Technol
  • 被引频次:   1
  • DOI:   10.1007/s10853-019-04286-x
  • 出版年:   2020

▎ 摘  要

Van der Waals (vdW) type metallic/semiconducting heterostructures have attracted much attention for applications like nanoelectronics. The electronic properties of graphene/SnSe2 vdW heterostructure are investigated by the first-principles calculation. The band dispersions of both the graphene and SnSe2 layers are well preserved in the graphene/SnSe2 vdW heterostructure. Notably, n-type Ohmic contact is found at the graphene/SnSe2 vdW interface so that graphene is a fantastic electrode for the SnSe2 Schottky barrier field-effect transistor (SBFET). The on-state current of the 10-nm-gate-long ML SnSe2 SBFET with graphene electrode is 1535 mu A/lm for high-performance (HP) application, which is twice that of the ML MoS2 SBFET with bulk Ti electrode and exceeds the requirement of the International Technology Roadmap for Semiconductors for HP devices.