• 文献标题:   Charge Transport in UV-Oxidized Graphene and Its Dependence on the Extent of Oxidation
  • 文献类型:   Article
  • 作  者:   LEE HY, HAIDARI MM, KEE EH, CHOI JS, PARK BH, CAMPBELL EEB, JHANG SH
  • 作者关键词:   graphene oxide, defect density, transport gap, band gap, metalinsulator transition, 2d mott vrh
  • 出版物名称:   NANOMATERIALS
  • ISSN:  
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.3390/nano12162845
  • 出版年:   2022

▎ 摘  要

Graphene oxides with different degrees of oxidation are prepared by controlling UV irradiation on graphene, and the charge transport and the evolution of the transport gap are investigated according to the extent of oxidation. With increasing oxygenous defect density n(D), a transition from ballistic to diffusive conduction occurs at n(D)similar or equal to 10(12) cm(-2) and the transport gap grows in proportion to root n(D). Considering the potential fluctuation related to the e-h puddle, the bandgap of graphene oxide is deduced to be Eg similar or equal to 30 root n(D)(10(12)cm(-2)) meV. The temperature dependence of conductivity showed metal-insulator transitions at n(D)similar or equal to 0.3x10(12) cm(-2), consistent with Ioffe-Regel criterion. For graphene oxides at n(D)>= 4.9x10(12) cm(-2), analysis indicated charge transport occurred via 2D variable range hopping conduction between localized sp(2) domain. Our work elucidates the transport mechanism at different extents of oxidation and supports the possibility of adjusting the bandgap with oxygen content.