• 文献标题:   Measurement of sub-10 fs Auger processes in monolayer graphene
  • 文献类型:   Article
  • 作  者:   GIOVANNI D, YU GN, XING GC, LEEK ML, SUM TC
  • 作者关键词:  
  • 出版物名称:   OPTICS EXPRESS
  • ISSN:   1094-4087
  • 通讯作者地址:   Nanyang Technol Univ
  • 被引频次:   3
  • DOI:   10.1364/OE.23.021107
  • 出版年:   2015

▎ 摘  要

Despite the concerted efforts to directly probe the electronelectron ( e-e) scattering mediated relaxation process in graphene using transient absorption spectroscopy, the initial sub-10 fs photoexcited carrier relaxation dynamics has remained elusive. Herein, we utilize a simple zscan approach to elucidate this process and discern its mechanisms in CVD grown single layer graphene using femtosecond laser pulses with temporal pulse widths far longer than the relaxation time. We report the first experimental observation of e-e scattering lifetime shortening with increasing fluence, which had been theoretically predicted. Analysis from two-body Coulombic scattering suggests that Auger processes are essential relaxation channels in single layer graphene. Importantly, our straightforward approach on the graphene model system is applicable to the family of emergent layered materials. (C) 2015 Optical Society of America