• 文献标题:   Visualizing In-Plane Junctions in Nitrogen-Doped Graphene
  • 文献类型:   Article
  • 作  者:   BOUATOU M, CHACON C, LORENTZEN AB, NGO HT, GIRARD Y, REPAIN V, BELLEC A, ROUSSET S, BRANDBYGE M, DAPPE YJ, LAGOUTE J
  • 作者关键词:   graphene, nitrogen dopant, pn junction, scanning tunneling microscopy
  • 出版物名称:   ADVANCED FUNCTIONAL MATERIALS
  • ISSN:   1616-301X EI 1616-3028
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.1002/adfm.202208048 EA SEP 2022
  • 出版年:   2022

▎ 摘  要

Controlling the spatial distribution of dopants in graphene is the gateway to the realization of graphene-based electronic components. Here, it is shown that a submonolayer of self-assembled physisorbed molecules can be used as a resist during a post-synthesis nitrogen doping process to realize a nanopatterning of nitrogen dopants in graphene. The resulting formation of domains with different nitrogen concentrations allows obtaining n-n' and p-n junctions in graphene. A scanning tunneling microscopy is used to measure the electronic properties of the junctions at the atomic scale and reveal their intrinsic width that is found to be approximate to 7 nm corresponding to a sharp junction regime.