• 文献标题:   Direct Measurement of the Growth Mode of Graphene on SiC(0001) and SiC(000(1)over-bar)
  • 文献类型:   Article
  • 作  者:   HANNON JB, COPEL M, TROMP RM
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW LETTERS
  • ISSN:   0031-9007 EI 1079-7114
  • 通讯作者地址:   IBM Corp
  • 被引频次:   33
  • DOI:   10.1103/PhysRevLett.107.166101
  • 出版年:   2011

▎ 摘  要

We have determined the growth mode of graphene on SiC(0001) and SiC(000 (1) over bar) using ultrathin, isotopically labeled (SiC)-C-13 "marker layers" grown epitaxially on the (SiC)-C-12 surfaces. Few-layer graphene overlayers were formed via thermal decomposition at elevated temperature. For both surface terminations (Si face and C face), we find that the C-13 is located mainly in the outermost graphene layers, indicating that, during decomposition, new graphene layers form underneath existing ones.