• 文献标题:   Graphene-assisted spontaneous relaxation towards dislocation-free heteroepitaxy
  • 文献类型:   Article
  • 作  者:   BAE SH, LU KY, HAN YM, KIM S, QIAO K, CHOI C, NIE YF, KIM H, KUM HS, CHEN P, KONG W, KANG BS, KIM C, LEE J, BAEK Y, SHIM J, PARK J, JOO M, MULLER DA, LEE K, KIM J
  • 作者关键词:  
  • 出版物名称:   NATURE NANOTECHNOLOGY
  • ISSN:   1748-3387 EI 1748-3395
  • 通讯作者地址:   MIT
  • 被引频次:   8
  • DOI:   10.1038/s41565-020-0633-5
  • 出版年:   2020

▎ 摘  要

Although conventional homoepitaxy forms high-quality epitaxial layers(1-5), the limited set of material systems for commercially available wafers restricts the range of materials that can be grown homoepitaxially. At the same time, conventional heteroepitaxy of lattice-mismatched systems produces dislocations above a critical strain energy to release the accumulated strain energy as the film thickness increases. The formation of dislocations, which severely degrade electronic/photonic device performances(6-8), is fundamentally unavoidable in highly lattice-mismatched epitaxy(9-11). Here, we introduce a unique mechanism of relaxing misfit strain in heteroepitaxial films that can enable effective lattice engineering. We have observed that heteroepitaxy on graphene-coated substrates allows for spontaneous relaxation of misfit strain owing to the slippery graphene surface while achieving single-crystalline films by reading the atomic potential from the substrate. This spontaneous relaxation technique could transform the monolithic integration of largely lattice-mismatched systems by covering a wide range of the misfit spectrum to enhance and broaden the functionality of semiconductor devices for advanced electronics and photonics. The spontaneous relaxation of misfit strain achieved on graphene-coated substrates enables the growth of heteroepitaxial single-crystalline films with reduced dislocation density.