• 文献标题:   High I-on/I-off current ratio graphene field effect transistor: the role of line defect
  • 文献类型:   Article
  • 作  者:   TAJARROD MH, SAGHAI HR
  • 作者关键词:   field effect transistor, graphene, line defect
  • 出版物名称:   BEILSTEIN JOURNAL OF NANOTECHNOLOGY
  • ISSN:   2190-4286
  • 通讯作者地址:   Islamic Azad Univ
  • 被引频次:   2
  • DOI:   10.3762/bjnano.6.210
  • 出版年:   2015

▎ 摘  要

The present paper casts light upon the performance of an armchair graphene nanoribbon (AGNR) field effect transistor in the presence of one-dimensional topological defects. The defects containing 5-8-5sp(2)-hybridized carbon rings were placed in a perfect graphene sheet. The atomic scale behavior of the transistor was investigated in the non-equilibrium Green's function (NEGF) and tight-binding Hamiltonian frameworks. AGNRFET basic terms such as the on/off current, transconductance and subthreshold swing were investigated along with the extended line defect (ELD). The results indicated that the presence of ELDs had a significant effect on the parameters of the GNRFET. Compared to conventional transistors, the increase of the I-on/I-off ratio in graphene transistors with ELDs enhances their applicability in digital devices.