▎ 摘　　要

Novel electrical measurement method, discharge current analysis (DCA), is introduced to extract the density and energy distribution of charge traps at the dielectric interface of top-gate graphene field-effect transistors. Using DCA method, the highest charge trap density similar to 10(13) (cm(-2) . eV(-1)) is extracted at Fermi level similar to 0.4 eV. This is the first quantitative estimation of trap density at a specific Fermi level of graphene.