▎ 摘　　要

An approach utilizing low energy N ion beam irradiation is applied in joining two monolayer graphene flakes. Raman spectrometry and atomic force microscopy show the joining signal under 40 eV and 1 x 10(14) cm(-2) N ion irradiation. Molecular dynamics simulations demonstrate that the joining phenomenon is attributed to the punch-down effect and the subsequent chemical bond generation between the two sheets. The generated chemical bonds are made up of inserted ions (embedded joining) and knocked-out carbon atoms (saturation joining). The electronic transport properties of the joint are also calculated for its applications. Published by AIP Publishing.