• 文献标题:   Effect of rotational stacking faults on the Raman spectra of folded graphene
  • 文献类型:   Article
  • 作  者:   PONCHARAL P, AYARI A, MICHEL T, SAUVAJOL JL
  • 作者关键词:   graphene, raman spectra, spectral line shift, stacking fault, thin film
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   2469-9950 EI 2469-9969
  • 通讯作者地址:   Univ Lyon 1
  • 被引频次:   25
  • DOI:   10.1103/PhysRevB.79.195417
  • 出版年:   2009

▎ 摘  要

The Raman spectral signature of folded graphene layers for one to six layers was studied. Folding allows realization of rotational disorder in otherwise perfect samples. We show that the two-dimensional Raman band of the folded sample is up shifted compared to the unfolded sample. The evolution of the spectral signature with increasing number of layers is discussed.