• 文献标题:   Molecular orientation of terephthalic acid assembly on epitaxial graphene: NEXAFS and XPS study
  • 文献类型:   Article
  • 作  者:   ZHANG WH, NEFEDOV A, NABOKA M, CAO L, WOLL C
  • 作者关键词:  
  • 出版物名称:   PHYSICAL CHEMISTRY CHEMICAL PHYSICS
  • ISSN:   1463-9076 EI 1463-9084
  • 通讯作者地址:   Karlsruhe Inst Technol
  • 被引频次:   43
  • DOI:   10.1039/c2cp23748b
  • 出版年:   2012

▎ 摘  要

The adsorption of terephthalic acid molecules [C6H4(COOH)(2)), TPA] on a single layer of graphene grown epitaxially on Ni(111) has been investigated by means of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and X-ray photoelectron spectroscopy (XPS) at room temperature. The assignment of the NEXAFS resonances was aided by ab initio calculations for the free TPA molecule. For coverages up to a monolayer the molecular plane of TPA adopts a parallel orientation with regard to the epitaxial graphene (EG) layer. Deprotonation of TPA molecules at one monolayer coverage can be excluded. For TPA multilayers, the molecular plane is tilted on average by approximately 45 degrees with respect to the sample surface.