• 文献标题:   Structural changes in graphene oxide thin film by electron-beam irradiation
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   TYAGI C, LAKSHMI GBVS, KUMAR S, TRIPATHI A, AVASTHI DK
  • 作者关键词:   graphene oxide, reduced graphene oxide, xray diffraction, raman microscopy, organic moietie
  • 出版物名称:   NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION BBEAM INTERACTIONS WITH MATERIALS ATOMS
  • ISSN:   0168-583X EI 1872-9584
  • 通讯作者地址:   Inter Univ Accelerator Ctr
  • 被引频次:   5
  • DOI:   10.1016/j.nimb.2016.02.046
  • 出版年:   2016

▎ 摘  要

Although we have a whole class of 2D materials, graphene has drawn much attention for its excellent electronic, optical, thermal and mechanical properties. Recent researches have shown its large scale production by the reduction of graphene oxide either thermally, chemically or electrochemically. Although the structure of graphene oxide is inhomogeneous and hence complicated due to the presence of organic moieties e.g. epoxy, carboxylic acid, hydroxyl groups etc., its properties can be tuned by reduction according to desired application. The aim of this work is to synthesize continuous thin film of graphene oxide using commercially available graphene oxide solution and to study its reduction by 25 keV electron beam irradiation at fluences varying from 2 x 10(11) to 2 x 10(13) e(-)/cm(2). Our studies using X-ray diffraction, Raman microscopy and UV-Vis spectroscopy showed that electron-beam irradiation is an effective tool for reduction of graphene oxide and for tuning its band gap. (C) 2016 Elsevier B.V. All rights reserved.