▎ 摘　　要

X-ray Absorption Spectroscopy (XAS) is used for measuring monolayer quantities of Ho3N@C-80 endofullerene molecules on graphene at a low flux bending magnet beamline. The total electron yield is measured with an Everhart-Thornley detector. In comparison to sample current measurements with the same noise level, our approach reduces data acquisition time and radiation dose by a factor of 25. As the first application of this setup, we report temperature-dependent measurements of the Ho M-45 edge with per mille accuracy. This documents the advantages and capabilities of an Everhart-Thornely detector for XAS measurements under low x-ray flux. Published under an exclusive license by the AVS.