• 文献标题:   Side-illuminated tip-enhanced Raman study of edge phonon in graphene at the electrical breakdown limit
  • 文献类型:   Article
  • 作  者:   OKUNO Y, VANTASIN S, YANG IS, SON J, HONG J, TANAKA YY, NAKATA Y, OZAKI Y, NAKA N
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   HORIBA Ltd
  • 被引频次:   2
  • DOI:   10.1063/1.4947559
  • 出版年:   2016

▎ 摘  要

Nanoscale integration of graphene into a circuit requires a stable performance under high current density. However, the effects of the current density that approach the electronic breakdown limit of graphene are not well understood. We explored the effects of a high current density, close to the electronic breakdown limit of 10 A/cm (similar to 3.0 x 10(8) A/cm(2)), on graphene, using tip-enhanced Raman scattering. The results showed that the high current density induces Raman bands at 1456 and 1530 cm(-1), which were assigned to edge-phonon modes originating from zigzag and armchair edges. This led us to conclude that C-C bonds are cleaved due to the high current density, leaving edge structures behind, which were detected through the observation of localized phonons. Published by AIP Publishing.