• 文献标题:   Vacancy Assisted Bilayer Graphene Contact for Monolayer Graphene Channel Devices
  • 文献类型:   Article
  • 作  者:   MEERSHA A, KUMAR J, MISHRA A, VARIAR HB, SHRIVASTAVA M
  • 作者关键词:   graphene, contact resistance, kelvin, orbit, resistance, probe, metal, dft, negf, graphene, metal, vacancy, quantumatk
  • 出版物名称:   IEEE ELECTRON DEVICE LETTERS
  • ISSN:   0741-3106 EI 1558-0563
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.1109/LED.2023.3250329
  • 出版年:   2023

▎ 摘  要

Contact engineering of monolayer graphene channel FETs has been a fundamental limiting factor hindering its intrinsic benefits for applications such as THz electronics, quantum sensing, quantum computing/communication devices, etc. This experimental work presents a unique technique to achieve record low contact resistance using carbon vacancy-assisted bilayer graphene contact. The bilayer graphene contact with engineered carbon vacancies lowered the metal-graphene interfacial distance and enhanced the atomic orbital overlap, eventually lowering the contact resistance. The interfacial properties and orbital interactions are investigated using density functional theory and non equilibrium Green's function based transport computations. The reduction in contact resistance is then experimentally validated using unique Kelvin probe structures with monolayer and bilayer contacts. The captured contact resistance is as low as similar to 36 Omega.mu m, which is a record low contact resistance value reported to date.