• 文献标题:   A model for length of saturation velocity region in double-gate Graphene nanoribbon transistors
  • 文献类型:   Article
  • 作  者:   GHADIRY MH, NADI M, AHMADI MT, ABD MANAF A
  • 作者关键词:  
  • 出版物名称:   MICROELECTRONICS RELIABILITY
  • ISSN:   0026-2714
  • 通讯作者地址:   Univ Sains Malaysia
  • 被引频次:   14
  • DOI:   10.1016/j.microrel.2011.07.009
  • 出版年:   2011

▎ 摘  要

Length of saturation region (LVSR) as an important parameter in nanoscale devices, which controls the drain breakdown voltage is in our focus. This paper presents three models for surface potential, surface electric field and LVSR in double-gate Graphene nanoribbon transistors. The Poisson equation is used to derive surface potential, lateral electric field and LVSR. Using the proposed models, the effect of several parameters such as drain-source voltage, oxide thickness, doping concentration and channel length on the LVSR is studied. (C) 2011 Elsevier Ltd. All rights reserved.