• 文献标题:   Determining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations
  • 文献类型:   Article
  • 作  者:   LIU Y, WEINERT M, LI L
  • 作者关键词:   graphene vacancy, charge state, local contact potential, noncontact afm
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:   Univ Wisconsin
  • 被引频次:   6
  • DOI:   10.1088/0957-4484/26/3/035702
  • 出版年:   2015

▎ 摘  要

Graphene vacancies are engineered for novel functionalities, however, the charge state of these defects, the key parameter that is vital to charge transfer during chemical reactions and carrier scattering, is generally unknown. Here, we carried out atomic resolution imaging of graphene vacancy defects created by Ar plasma using noncontact atomic force microscopy, and made the first determination of their charge state by local contact potential difference measurements. Combined with density functional theory calculations, we show that graphene vacancies are typically positively charged, with size-dependent charge states that are not necessarily integer-valued. These findings provide new insights into carrier scattering by vacancy defects in graphene, as well as its functionalization for chemical sensing and catalysis, and underline the tunability of these functions by controlling the size of vacancy defect.