• 文献标题:   Selective nano-patterning of graphene using a heated atomic force microscope tip
  • 文献类型:   Article
  • 作  者:   CHOI YS, WU X, LEE DW
  • 作者关键词:  
  • 出版物名称:   REVIEW OF SCIENTIFIC INSTRUMENTS
  • ISSN:   0034-6748 EI 1089-7623
  • 通讯作者地址:   Chonnam Natl Univ
  • 被引频次:   6
  • DOI:   10.1063/1.4870588
  • 出版年:   2014

▎ 摘  要

In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 mu m/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO2 layer, with a tip contact force of 100 nN. (C) 2014 AIP Publishing LLC.