• 文献标题:   In-plane and tunneling pressure sensors based on graphene/hexagonal boron nitride heterostructures
  • 文献类型:   Article
  • 作  者:   XU Y, GUO ZD, CHEN HB, YUAN Y, LOU JC, LIN X, GAO HY, CHEN HS, YU B
  • 作者关键词:   boron compound, graphene, iiiv semiconductor, nanosensor, pressure sensor, semiconductor heterojunction, tunnelling, wide band gap semiconductor
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Zhejiang Univ
  • 被引频次:   59
  • DOI:   10.1063/1.3643899
  • 出版年:   2011

▎ 摘  要

An in-plane pressure sensor (IPPS) consisting of graphene sandwiched by hexagonal boron nitride (h-BN) and a tunneling pressure sensor (TPS) consisting of h-BN sandwiched by graphene are demonstrated. The responses as function of external pressure are modeled. The current varies by 3 orders of magnitude as pressure increases from 0 to 5 nN/nm(2). The IPPS current is negatively correlated to pressure, whereas TPS current exhibits positive correlation to pressure. The IPPS design is insensitive to the number of wrapping h-BN layers, indicating precise process control is unnecessary. The result paves a viable avenue towards realizing of atomic scale pressure sensors. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3643899]