• 文献标题:   Scanning probe microscopy and spectroscopy of graphene on metals
  • 文献类型:   Article
  • 作  者:   DEDKOV Y, VOLOSHINA E, FONIN M
  • 作者关键词:   atomic force microscopy, density functional theory, graphene, metal surface, scanning tunneling microscopy
  • 出版物名称:   PHYSICA STATUS SOLIDI BBASIC SOLID STATE PHYSICS
  • ISSN:   0370-1972 EI 1521-3951
  • 通讯作者地址:   SPECS Surface Nano Anal GmbH
  • 被引频次:   18
  • DOI:   10.1002/pssb.201451466
  • 出版年:   2015

▎ 摘  要

Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from m to atoms). This review focuses on the recent applications of these microscopic/spectroscopic methods for the investigation of graphene on metals (interfaces, intercalation-like systems, graphene nanoribbons, and quantum dots, etc.). It is shown that very important information about interaction strength at the graphene/metal interfaces as well as about modification of the electronic spectrum of graphene at the Fermi level can be obtained on the local scale. The combination of these results with those obtained by other methods and comparison with recent theoretical data demonstrate the power of this approach for the investigation of the graphene-based systems. STM image of a graphene island (quantum dot) on Ir(111).