• 专利标题:   Method for coating graphene on probe for atomic force microscope, involves dissolving polymeric layers by solvent agent, such that graphene layer is attached to surface of probe.
  • 专利号:   WO2014090938-A1
  • 发明人:   DUAN H, PORTI PUJAL M, LANZA MARTINEZ M, BAYERL A, NAFRIA MAQUEDA M
  • 专利权人:   UNIV AUTONOMA BARCELONA, UNIV PEKING
  • 国际专利分类:   G01Q060/40, G01Q070/14
  • 专利详细信息:   WO2014090938-A1 19 Jun 2014 G01Q-060/40 201442 Pages: 22 English
  • 申请详细信息:   WO2014090938-A1 WOEP076362 12 Dec 2013
  • 优先权号:   EP382504

▎ 摘  要

NOVELTY - The method involves coating a base by a first polymeric layer. A probe (11) is attached over the first polymeric layer. The probe is coated by a second polymeric layer. A polymeric substrate is deposited by a graphene layer over the second polymeric layer. The polymeric layers are dissolved by a solvent agent, such that graphene layer is attached to a surface of the probe. USE - Method for coating graphene on probe e.g. platinum/iridium varnished probe (Claimed) for atomic force microscope. ADVANTAGE - The dissolving step is carried out over a period of approximately 30 minutes to assure the smoothness of the etching process, so that falls and breakages of the probe can be prevented. The coating process is developed over the conductive surface of an atomic force microscope tip using a graphene single layer film. The tip of probe is totally coated with graphene, so that higher resistant is provided to both high currents and frictions than commercially available metal-varnished CAFM tips. Thus, lifetime can be extended and reliable imaging is achieved due to a lower tip-sample interaction. The camera serves as vapor enclosure to increase etching yield and constant etching on the entire sample. The camera remains open on the top to avoid that drops of condensed acetone precipitate on the sample. The poly-methyl methacrylate (PMMA) layers are dissolved gradually and simultaneously without losing a horizontal position, so that slippage into the boiling acetone can be avoided. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a probe for an atomic force microscope. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of the platinum/iridium varnished probe. Probe (11) Cantilever (12) Silicon substrate (81) Conductive layer (82)